[IEEE 2018 IEEE Far East NDT New Technology &...

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[IEEE 2018 IEEE Far East NDT New Technology & Application Forum (FENDT) - Xiamen, China (2018.7.6-2018.7.8)] 2018 IEEE Far East NDT New Technology & Application Forum (FENDT) - An Experimental Comparison of LED and Eddy Current Pulse-Compression Thermography on an Impact Damage CFRP Benchmark Sample

Malekmohammadi, Hamed, Laureti, Stefano, Ricci, Marco, Yi, Qiuji, Zhu, Junzhen, Tian, Gui Yun
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Year:
2018
DOI:
10.1109/FENDT.2018.8681968
File:
PDF, 2.85 MB
2018
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