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[IEEE 2019 International Conference on IC Design and Technology (ICICDT) - SUZHOU, China (2019.6.17-2019.6.19)] 2019 International Conference on IC Design and Technology (ICICDT) - Threshold Voltage Tuning Of 22 nm FD-SOI Devices Fabricated With Metal Gate Last Process
Xu, Cuiqin, Wang, Xuejiao, Liu, WeiYear:
2019
DOI:
10.1109/ICICDT.2019.8790860
File:
PDF, 656 KB
2019