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Dual-Frequency Interrogation and Hierarchical Evaluation Scheme for SAW Reflective Delay-Line Sensors
Shi, Ruchuan, Ruan, Jingping, Lv, Jiashi, Zhang, Chenrui, Han, Tao, Qin, Peng, Li, Ping, Wen, YumeiYear:
2019
Journal:
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
DOI:
10.1109/TUFFC.2019.2933435
File:
PDF, 1.13 MB
2019