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[IEEE 2018 International Conference on Computational and Characterization Techniques in Engineering & Sciences (CCTES) - Lucknow, India (2018.9.14-2018.9.15)] 2018 International Conference on Computational and Characterization Techniques in Engineering & Sciences (CCTES) - Impact of Extrinsic Reliability Issues including Radiation and Temperature on SiGe HBT
KumarVerma, Yogesh, Mishra, Varun, Verma, Prateek Kishor, Gupta, Santosh Kumar, Chauhan, Rajeev KumarYear:
2018
Language:
english
DOI:
10.1109/CCTES.2018.8674073
File:
PDF, 684 KB
english, 2018