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[IEEE 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Singapore, Singapore (2019.3.12-2019.3.15)] 2019 Electron Devices Technology and Manufacturing Conference (EDTM) - Random Telegraph Noise after Hot Carrier Injection in Tri-gate Nanowire Transistor
Ota, Kensuke, Ichihara, Reika, Suzuki, Masamichi, Saitoh, Masumi, Mitani, YuichiroYear:
2019
Language:
english
DOI:
10.1109/EDTM.2019.8731025
File:
PDF, 176 KB
english, 2019