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[IEEE 2018 IEEE Frontiers in Education Conference (FIE) - San Jose, CA, USA (2018.10.3-2018.10.6)] 2018 IEEE Frontiers in Education Conference (FIE) - Examination the impact of various factors on student success in an introduction to circuit analysis course
Parent, David W.Year:
2018
Language:
english
DOI:
10.1109/FIE.2018.8659259
File:
PDF, 1.23 MB
english, 2018