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[IEEE 2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2019.4.16-2019.4.18)] 2019 IEEE 39th International Conference on Electronics and Nanotechnology (ELNANO) - Reflectivity of Porous Silicon Matrix as Analyte ‘Logical’ Pattern
Ivanov, Ivan, Skryshevsky, ValeriyYear:
2019
Language:
english
DOI:
10.1109/elnano.2019.8783422
File:
PDF, 368 KB
english, 2019