The input pattern problem on deep learning applied to signal analysis and processing to achieve fault diagnosis
Ren, Hao, Li, Nan, Chai, Yi, Qu, Jianfeng, Tang, Qiu, Huang, LeiVolume:
62
Language:
english
Journal:
Science China Information Sciences
DOI:
10.1007/s11432-018-9564-6
Date:
December, 2019
File:
PDF, 195 KB
english, 2019