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Design and characterization of dielectric filled TM 110 microwave cavities for ultrafast electron microscopy
Verhoeven, W., van Rens, J. F. M., Kemper, A. H., Rietman, E. H., van Doorn, H. A., Koole, I., Kieft, E. R., Mutsaers, P. H. A., Luiten, O. J.Volume:
90
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5080003
Date:
August, 2019
File:
PDF, 2.54 MB
english, 2019