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Elimination of the Parasitic Metal Resistance in Transmission Line Model for Extraction of Ultralow Specific Contact Resistivity
Wu, Ying, Xu, Haiwen, Gong, Xiao, Yeo, Yee-ChiaVolume:
66
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2917930
Date:
July, 2019
File:
PDF, 1.71 MB
english, 2019