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[IEEE 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Accurate Measurement of Sneak Current in ReRAM Crossbar Array with Data Storage Pattern Dependencies
Shang, Yaqi, Ohsawa, TakashiYear:
2019
Language:
english
DOI:
10.1109/VLSI-TSA.2019.8804668
File:
PDF, 653 KB
english, 2019