[IEEE 2018 IEEE 27th Asian Test Symposium (ATS) - Hefei, China (2018.10.15-2018.10.18)] 2018 IEEE 27th Asian Test Symposium (ATS) - Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS
Yan, Aibin, Ling, Yafei, Yang, Kang, Chen, Zhili, Yi, MaoxiangYear:
2018
Language:
english
DOI:
10.1109/ats.2018.00027
File:
PDF, 661 KB
english, 2018