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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Analysis of Different Characteristics of SOI-TFET with Ge Material as Source Pocket
Sinha, Sanjeet Kumar, Tripathi, Suman Lata, Chatterjee, Goutam, Chand, NisargaYear:
2018
Language:
english
DOI:
10.1109/edkcon.2018.8770221
File:
PDF, 414 KB
english, 2018