[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Simulation of 2D Layered Material Ballistic FETs using a Hybrid Methodology
Pon, Adhithan, Carmel, Santhia, Bhattacharyya, Arkaprava, Rathinam, RameshYear:
2019
DOI:
10.1109/edssc.2019.8754400
File:
PDF, 494 KB
2019