[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - A Reliability Analysis of a Deep Neural Network
Bosio, Alberto, Bernardi, Paolo, Ruospo, Annachiara, Sanchez, ErnestoYear:
2019
Language:
english
DOI:
10.1109/latw.2019.8704548
File:
PDF, 3.64 MB
english, 2019