[IEEE 2019 IEEE Latin American Test Symposium (LATS) -...

  • Main
  • [IEEE 2019 IEEE Latin American Test...

[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - A Reliability Analysis of a Deep Neural Network

Bosio, Alberto, Bernardi, Paolo, Ruospo, Annachiara, Sanchez, Ernesto
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/latw.2019.8704548
File:
PDF, 3.64 MB
english, 2019
Conversion to is in progress
Conversion to is failed