From Virtual Characterization to Test-Chips: DFM Analysis through Pattern Enumeration
Martins, Mayler G. A., Pagliarini, Samuel, Isgenc, Meric, Pileggi, LarryYear:
2018
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2018.2889772
File:
PDF, 730 KB
english, 2018