In Situ Nanostructural Analysis of Volatile Threshold...

  • Main
  • 2019 / 08
  • In Situ Nanostructural Analysis of Volatile Threshold...

In Situ Nanostructural Analysis of Volatile Threshold Switching and Non‐Volatile Bipolar Resistive Switching in Mixed‐Phased a ‐VO x Asymmetric Crossbars

Nirantar, Shruti, Mayes, Edwin, Rahman, Md. Ataur, Ahmed, Taimur, Taha, Mohammad, Bhaskaran, Madhu, Walia, Sumeet, Sriram, Sharath
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201900605
Date:
August, 2019
File:
PDF, 1.78 MB
english, 2019
Conversion to is in progress
Conversion to is failed