[IEEE 2019 Symposium on Design, Test, Integration &...

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[IEEE 2019 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Paris, France (2019.5.12-2019.5.15)] 2019 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Impact of γ-rays and protons on integrated magnetic inductors

Oumar, D.A., Boukhari, M.I., Capraro, S., Girard, S., Pietroy, D., Chatelon, J.P., Rousseau, J.J., Paillet, P., Trinczek, M.
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Year:
2019
Language:
english
DOI:
10.1109/DTIP.2019.8752673
File:
PDF, 885 KB
english, 2019
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