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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Comparison of Linearity Performance of InAs Based DG-MOSFETs with Gate Stack, SiO2 and HfO2
Swain, Sanjit Kumar, Adak, Sarosij, Biswal, Sudhansu Mohan, Baral, Biswajit, Parija, SaradiyaYear:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770386
File:
PDF, 979 KB
english, 2018