[IEEE 2018 IEEE Electron Devices Kolkata Conference...

  • Main
  • [IEEE 2018 IEEE Electron Devices...

[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Impact of Donor Layer Thickness, Doping Concentration and Gate-Width on Gate-Capacitance of AlGaN/GaN Single and Double Heterostructure HEMT for Microwave Frequency Applications

Chugh, Nisha, Bhattacharya, Monika, Kumar, Manoj, Gupta, R.S
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
DOI:
10.1109/EDKCON.2018.8770426
File:
PDF, 756 KB
english, 2018
Conversion to is in progress
Conversion to is failed