[IEEE 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - Shenzhen (2018.6.6-2018.6.8)] 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - MEOL Gate-around Parasitic Capacitance Extraction Verification for Design Enablements in Advanced FinFET Technology

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