[IEEE 2019 IEEE International Conference on Electron...

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[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Simultaneous Fabrication of 4H-SiC BJT and UMOSFET on Same Wafer

Yuan, Lei, Liu, Sicheng, Song, Qingwen, Tang, Xiaoyan, Han, Chao, Zhang, Yimen, Zhang, Yuming
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Year:
2019
Language:
english
DOI:
10.1109/EDSSC.2019.8754198
File:
PDF, 222 KB
english, 2019
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