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[IEEE 2018 24th International Conference on Pattern Recognition (ICPR) - Beijing (2018.8.20-2018.8.24)] 2018 24th International Conference on Pattern Recognition (ICPR) - Radiometric confidence criterion for patch-based inpainting
Fayer, Julien, Morin, Geraldine, Gasparini, Simone, Daisy, Maxime, Coudrin, BenjaminYear:
2018
Language:
english
DOI:
10.1109/ICPR.2018.8545350
File:
PDF, 2.47 MB
english, 2018