[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Synaptic Behavior of Nanoscale ReRAM Devices for the Implementation in a Dynamic Neural Network Array
Beckmann, Karsten, Olin-Ammentorp, Wilkie, Russell, Sierra, Suguitan, Nadia, Hobbs, Chris, Rodgers, Martin, Cady, Nathaniel C., Rose, Garrett S., Van Nostrand, JosephYear:
2018
DOI:
10.1109/IIRW.2018.8727104
File:
PDF, 250 KB
2018