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[IEEE 2018 IEEE International Conference on Image Processing, Applications and Systems (IPAS) - Sophia Antipolis, France (2018.12.12-2018.12.14)] 2018 IEEE International Conference on Image Processing, Applications and Systems (IPAS) - Unsupervised Algorithm to Detect Damage Patterns in Microstructure Images of Metal Films
Alagic, Dzenana, Pilz, JurgenYear:
2018
Language:
english
DOI:
10.1109/IPAS.2018.8708852
File:
PDF, 3.30 MB
english, 2018