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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Transient self-heating modeling and simulations of back-end-of-line interconnects
Kim, Andrew, Li, Baozhen, Linder, BarryYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353672
File:
PDF, 746 KB
english, 2018