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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits
Weir, Bonnie, Prasad, Vani, Moinian, Shahriar, Park, SangJune, Blasko, Joseph, Brown, Jason, Pallinti, JayanthiYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720475
File:
PDF, 632 KB
english, 2019