[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability
Karmel Kranthi, Nagothu, Sampath Kumar, B., Salman, Akram, Boselli, Gianluca, Shrivastava, MayankYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720580
File:
PDF, 734 KB
english, 2019