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[IEEE 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Shanghai, China (2019.5.19-2019.5.23)] 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Short-Circuit Ruggedness Analysis of SiC JMOS and DMOS
Hsu, Fu-Jen, Yen, Cheng-Tyng, Hung, Chien-Chung, Chu, Kuo-Ting, Lee, Lurng-Shehng, Lee, Chwan-YingYear:
2019
Language:
english
DOI:
10.1109/ISPSD.2019.8757630
File:
PDF, 1.10 MB
english, 2019