[IEEE 2018 IEEE 4th Information Technology and Mechatronics Engineering Conference (ITOEC) - Chongqing, China (2018.12.14-2018.12.16)] 2018 IEEE 4th Information Technology and Mechatronics Engineering Conference (ITOEC) - Structural Damage Detection Based on Statistical Process Control
Sun, Huan-yu, Zhang, Li-taoYear:
2018
Language:
english
DOI:
10.1109/ITOEC.2018.8740359
File:
PDF, 4.14 MB
english, 2018