Potential-Induced Degradation Depends on Leakage Current...

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IEEE Journal of Photovoltaics 2019

Potential-Induced Degradation Depends on Leakage Current and Light/Electrical Bias in Cu(In,Ga)Se$_2$ Devices

Muzzillo, Christopher P., Glynn, Stephen, Hacke, Peter, Moutinho, Helio R., Young, Matthew R., Repins, Ingrid L., Mansfield, Lorelle M.
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Year:
2019
Language:
english
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/JPHOTOV.2019.2933189
File:
PDF, 1.14 MB
english, 2019
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