[IEEE 2019 II Workshop on Metrology for Industry 4.0 and...

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[IEEE 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Naples, Italy (2019.6.4-2019.6.6)] 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Advanced Process Defect Monitoring Model and Prediction Improvement by Artificial Neural Network in Kitchen Manufacturing Industry: a Case of Study

Massaro, Alessandro, Manfredonia, Ivano, Galiano, Angelo, Xhahysa, Benny
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Year:
2019
Language:
english
DOI:
10.1109/METROI4.2019.8792872
File:
PDF, 692 KB
english, 2019
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