Classification of Faults in Multi-Core Cable via...

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Classification of Faults in Multi-Core Cable via Time-Frequency Domain Reflectometry

Bang, Su Sik, Shin, Yong-June
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2019.2920606
File:
PDF, 3.74 MB
english, 2019
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