A Fluxgate-Based Approach for Ion Beam Current Measurement...

IEEE Transactions on Instrumentation and Measurement 2019 / 5 Vol. 68; Iss. 5

A Fluxgate-Based Approach for Ion Beam Current Measurement in ECRIS Beamline: Design and Preliminary Investigations

Ando, Bruno, Baglio, Salvatore, Crispino, Ruben, Graziani, Salvatore, Marletta, Vincenzo, Mazzaglia, Alfio, Sinatra, Valentina, Mascali, David, Torrisi, Giuseppe
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Volume:
68
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2018.2878612
Date:
May, 2019
File:
PDF, 3.63 MB
english, 2019
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