[IEEE 2019 20th International Conference on Solid-State...

  • Main
  • [IEEE 2019 20th International...

[IEEE 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII) - Berlin, Germany (2019.6.23-2019.6.27)] 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII) - On-Chip Precision Residual Strain Diagnostic Based on Gap-Dependent Electrical Stiffness

Ozgurluk, Alper, Nguyen, Clark T.-C.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
DOI:
10.1109/TRANSDUCERS.2019.8808299
File:
PDF, 4.68 MB
english, 2019
Conversion to is in progress
Conversion to is failed