[IEEE 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Failure Root Cause Analysis Automation on Functional Simulation Regressions
Yen, Chia-Chih JackYear:
2019
Language:
english
DOI:
10.1109/VLSI-DAT.2019.8741656
File:
PDF, 517 KB
english, 2019