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[IEEE 2019 IEEE International Conference on Computational Electromagnetics (ICCEM) - Shanghai, China (2019.3.20-2019.3.22)] 2019 IEEE International Conference on Computational Electromagnetics (ICCEM) - Statistical Modeling of Dielectric metamaterial with Fabrication Imperfection Tolerance
Zhou, Shihao, Hu, Yanmeng, Li, Mengmeng, Yu, Yefeng, Chen, RushanYear:
2019
Language:
english
DOI:
10.1109/compem.2019.8779053
File:
PDF, 2.41 MB
english, 2019