[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Simulation Analysis of the Influence of Electrostatic Charge on High Resistance Guarded Hamon Transfer Devices Accuracy
Kocjan, Bartlomiej, Krawczyk, Krystian, Lisowski, MlchalYear:
2018
Language:
english
DOI:
10.1109/cpem.2018.8501247
File:
PDF, 544 KB
english, 2018