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[IEEE 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - Kolkata, India (2018.11.24-2018.11.25)] 2018 IEEE Electron Devices Kolkata Conference (EDKCON) - An Extensive Simulation Study of Gaussian Drain Doped Heterojunction Double Gate TFET

Sahoo, Sasmita, Dash, Sidhartha, Mishra, Guru Prasad
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Year:
2018
Language:
english
DOI:
10.1109/edkcon.2018.8770387
File:
PDF, 906 KB
english, 2018
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