[IEEE 2019 IEEE Latin American Test Symposium (LATS) -...

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[IEEE 2019 IEEE Latin American Test Symposium (LATS) - Santiago, Chile (2019.3.11-2019.3.13)] 2019 IEEE Latin American Test Symposium (LATS) - Identification of Logic Paths Influenced by Severe Coupling Capacitances

Meza-Ibarra, I. D., Champac, V., Gomez-Fuentes, R., Noriega, J. R., Vera-Marquina, A.
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Year:
2019
Language:
english
DOI:
10.1109/latw.2019.8704636
File:
PDF, 112 KB
english, 2019
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