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[IEEE 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2019.4.22-2019.4.25)] 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - TEMPO: Thermal-Efficient Management of Power in High-Throughput Network Switches
Munk, Tom, Kugler, Hillel, Maori, Ofir, Teman, AdamYear:
2019
DOI:
10.1109/vlsi-dat.2019.8741684
File:
PDF, 2.26 MB
2019