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Selective Probing of Thin Film Interfaces Using Internal Reflection Sum-Frequency Spectroscopy
Azam, Md. Shafiul, Cai, Canyu, Hore, Dennis KumarLanguage:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.9b06761
Date:
August, 2019
File:
PDF, 3.15 MB
english, 2019