[IEEE 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Cluj-Napoca, Romania (2019.4.24-2019.4.26)] 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Hybrid on-line self-test architecture for computational units on embedded processor cores
Floridia, Andrea, Mongano, Gianmarco, Piumatti, Davide, Sanchez, ErnestoYear:
2019
Language:
english
DOI:
10.1109/DDECS.2019.8724647
File:
PDF, 158 KB
english, 2019