[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions
Bahl, Sandeep R., Brohlin, PaulYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720479
File:
PDF, 901 KB
english, 2019