Measurement of Self-Heating Temperature in AlGaN/GaN HEMTs by Using Cerium Oxide Micro-Raman Thermometers
Brocero, G., Guhel, Y., Eudeline, P., Sipma, J. P., Gaquiere, C., Boudart, B.Year:
2019
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2935335
File:
PDF, 1.09 MB
english, 2019