[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Analysis of Characteristics of High Voltage IGBT under Low Temperature
Wang, Cailin, Tian, Qianhui, Yang, Wuhua, Cao, RongrongYear:
2019
Language:
english
DOI:
10.1109/edssc.2019.8754091
File:
PDF, 124 KB
english, 2019