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[IEEE 2018 12th International Conference on Sensing Technology (ICST) - Limerick (2018.12.4-2018.12.6)] 2018 12th International Conference on Sensing Technology (ICST) - Measurement of Light Sensitivity of Chromium/Porous Silicon Schottky Diodes Made by Silicon Nitride Masking
Selvam, Karthik, Rajashankar, Suma, Haji-Sheikh, Michael J.Year:
2018
Language:
english
DOI:
10.1109/icsenst.2018.8603629
File:
PDF, 793 KB
english, 2018