[ACM Press the 33rd Annual ACM Symposium - Pau, France (2018.04.09-2018.04.13)] Proceedings of the 33rd Annual ACM Symposium on Applied Computing - SAC '18 - Scaling topology pattern matching
Stein, Michael, Frömmgen, Alexander, Kluge, Roland, Wang, Lin, Wilberg, Augustin, Koldehofe, Boris, Mühlhäuser, MaxYear:
2018
Language:
english
DOI:
10.1145/3167132.3167241
File:
PDF, 1.86 MB
english, 2018