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[IEEE 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Naples, Italy (2019.6.4-2019.6.6)] 2019 II Workshop on Metrology for Industry 4.0 and IoT (MetroInd4.0&IoT) - Measuring randomness in IoT products
Bastos, Daniel Chicayban, Kowada, Luis Antonio Brasil, Machado, Raphael C. S.Year:
2019
Language:
english
DOI:
10.1109/METROI4.2019.8792883
File:
PDF, 822 KB
english, 2019