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[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Development of Wafer Level Process for the Fabrication of Advanced Capacitive Fingerprint Sensors Using Embedded Silicon Fan-Out (eSiFO(R)) Technology
Ma, Shuying, Wang, Chengqian, Zheng, Fengxia, Yu, Daquan, Xie, Hong, Yang, Xiaobing, Ma, Li, Li, Ping, Liu, Weidong, Yu, Jambo, Goodelle, JasonYear:
2019
Language:
english
DOI:
10.1109/ectc.2019.00012
File:
PDF, 861 KB
english, 2019